Silicified wood from around Old Faithful Geyser, Yellowstone National Park: Scanning Electron Microscopy (SEM)

Silicified wood samples were vacuum impregnated with epoxy, sectioned, and sputter coated with 10 nm Au/Pd at the U.S. Geological Survey, Menlo Park, CA.
Samples were imaged in a Tescan VEGA3 Scanning Electron Microscope (SEM) equipped with an Oxford 150 mm2 X-MaxN large area energy dispersive spectrometer at the U.S. Geological Survey, Menlo Park, CA. Backscatter (BSE) images were collected with an accelerating voltage (HV) of 30 kV and a working distance (WD) of ~15 mm. Magnifiaction is indicated on individual images. The data files for Scanning Electron Microsocopy (SEM) contain representative SEM-BSE images of samples OFL101 and OFL103-2.
This research was conducted under Yellowstone Research Permit YELL-SCI-8030.