Description
Sample Analyses: Unpolished bulk centimeter-scale sinter sub-samples were affixed to aluminum stubs using amorphous carbon paste and coated with 10 nm Au-Pd. Samples were analyzed at the USGS in Menlo Park, CA in a Tescan VEGA3 Scanning Electron Microscope (SEM). Stub-mount samples were imaged with secondary electrons.
Database Contents: The data files for “SEM Images” contain representative SEM images of cm-size pieces of samples UGB-TD-25, -26, -28, -30, -31, -33, -35.
Resources
| Name | Format | Description | Link |
|---|---|---|---|
| Original Metadata | XML | The metadata original format | Open resource |
| Digital Data | XML | Landing page for access to the data | Open resource |