Instance Segmentation of Dislocations in TEM Images

Description

This is the dataset and software for the IEEE publication Instance Segmentation of Dislocations in TEM Images to be published in 2023.

Resources

Name Format Description Link
0 http://data.europa.eu/88u/dataset/oai-zenodo-org-7965051
0 http://data.europa.eu/88u/dataset/oai-zenodo-org-7965051

Tags

  • deep-learning,-dislocation,-instance-segmentation,-tem,-materials-science,-microscopy

Topics

Categories