Three-dimensional in-situ imaging of single-grain growth in polycrystalline In2O3:Zr films
Description
Original data Here, we image a single-grain growth during the amorphous-to-polycrystalline transition in technologically relevant transparent conductive oxide (TCO) film of In2O3:Zr with in-situ Bragg coherent X-ray diffraction imaging. Data was obtained at 34ID-C end-station at Advanced Photon Source, Argonne National Laboratory (USA). Repository contains all raw datasets of the BCDI measurements, .spec files with corresponding meta-data, and .xlsx table with information on scan numbers related to annealing steps of the sample.
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http://data.europa.eu/88u/dataset/oai-zenodo-org-6532951 |
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http://data.europa.eu/88u/dataset/oai-zenodo-org-6532951 |
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http://data.europa.eu/88u/dataset/oai-zenodo-org-6532951 |
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http://data.europa.eu/88u/dataset/oai-zenodo-org-6532951 |
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http://data.europa.eu/88u/dataset/oai-zenodo-org-6532951 |
Tags
- bragg-coherent-x-ray-diffractive-imaging
- synchrotron
- grain-growth
- polycrystalline