Imaging ellipsometry on exfoliated GaS on sapphire substrate

Delta and Psi maps measured for wavelengths  200 nm to 900 nm with an Accurion EP4 ellipsometer. Ellipsometric enhanced contrast micrograph of the measured region - map.jpg Plotted Delta and Psi maps for 2, 2.5, 3, 3.2 and 3.5 eV are included.