Description
M. Landauer, F. Skopik, M. Wurzenberger, W. Hotwagner and A. Rauber, "Have it Your Way: Generating Customized Log Datasets With a Model-Driven Simulation Testbed," in IEEE Transactions on Reliability, vol. 70, no. 1, pp. 402-415, March 2021, doi: 10.1109/TR.2020.3031317.
Resources
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