The anisotropy in the optical constants of quartz crystals for soft X-rays
Description
The refractive index of a y-cut SiO2 crystal surface is reconstructed from polarization dependent soft X-ray reflectometry measurements in the energy range from 45 eV to 620 eV. In the datasets the 1-delta and beta values for the (100) and (001) direction of the SiO2 crystal for the different energies are provided.
Resources
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http://data.europa.eu/88u/dataset/oai-zenodo-org-4118056 |
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http://data.europa.eu/88u/dataset/oai-zenodo-org-4118056 |
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http://data.europa.eu/88u/dataset/oai-zenodo-org-4118056 |
Tags
- refractive-index
- anisotropy
- sio2-crystal