XPS measurements on long-term stability of organic radical thin films
Description
XPS raw data underlying Figures 1, 2, and 3 from the publication "Long-Term Degradation Mechanisms in Application-Implemented Radical Thin Films" (DOI: 10.1021/acsami.3c02057).
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http://data.europa.eu/88u/dataset/oai-zenodo-org-10854587 |
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http://data.europa.eu/88u/dataset/oai-zenodo-org-10854587 |
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http://data.europa.eu/88u/dataset/oai-zenodo-org-10854587 |
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http://data.europa.eu/88u/dataset/oai-zenodo-org-10854587 |