Supplementary material for the publication: Deep Learning of Crystalline Defects from TEM images: A Solution for the Problem of "Never Enough Training Data"

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Name Format Description Link
0 http://data.europa.eu/88u/dataset/oai-zenodo-org-10444815
0 http://data.europa.eu/88u/dataset/oai-zenodo-org-10444815
0 http://data.europa.eu/88u/dataset/oai-zenodo-org-10444815
0 http://data.europa.eu/88u/dataset/oai-zenodo-org-10444815
0 http://data.europa.eu/88u/dataset/oai-zenodo-org-10444815
0 http://data.europa.eu/88u/dataset/oai-zenodo-org-10444815
0 http://data.europa.eu/88u/dataset/oai-zenodo-org-10444815
0 http://data.europa.eu/88u/dataset/oai-zenodo-org-10444815
0 http://data.europa.eu/88u/dataset/oai-zenodo-org-10444815
0 http://data.europa.eu/88u/dataset/oai-zenodo-org-10444815
0 http://data.europa.eu/88u/dataset/oai-zenodo-org-10444815
0 http://data.europa.eu/88u/dataset/oai-zenodo-org-10444815
0 http://data.europa.eu/88u/dataset/oai-zenodo-org-10444815
0 http://data.europa.eu/88u/dataset/oai-zenodo-org-10444815

Tags

  • tem
  • deep-learning
  • microscopy
  • computer-vision
  • dislocation

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