NIST Electron Effective-Attenuation-Length Database - SRD 82

Description

The NIST Electron Effective Attenuation Length Database provides values of electron effective attenuation lengths (EALs) in materials at user-selected electron energies between 50 eV and 2,000 eV. The database was designed mainly to provide EALs (to account for effects of elastic-electron scattering) for measurements of the thicknesses of overlayer films and, to a much lesser extent, for measurements of the depths of thin marker layers. EALs are calculated using an algorithm based on electron transport theory for measurement conditions specified by the user. A critical review on the EAL has been published [A. Jablonski and C. J. Powell, Surf. Science Reports 47, 33 (2002)], and simple practical expressions for the EAL, mean escape depth, and information depth are given in another paper by the same authors [J. Vac. Sci. Technol. A 27, 253 (2009)].

Resources

Name Format Description Link
0 This database is free, but requires that a form be filled out in order to be able to download. https://www-s.nist.gov/srd_online/index.cfm?fuseaction=home.main&productID=SRD82v1.3
21 DOI Access to NIST Electron Effective-Attenuation-Length Database - SRD 82 https://dx.doi.org/10.18434/T4MK5P

Tags

  • effective-attenuation-length
  • photoelectron-spectroscopy
  • material-database
  • photoelectron
  • depth-distribution-function
  • auger-electron-spectroscopy
  • esca
  • x-ray-photoelectron-spectroscopy
  • electron-spectroscopy-for-chemical-analysis
  • surface-analysis
  • xps
  • photoemission

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