Description
Mapping the thickness of the Quaternary sediment is useful
for delineating the geologic framework of the New York Bight
inner-continental shelf. This in turn aids in understanding
the stratigraphic evolution of the inner-continental shelf,
the regional sediment transport system, and the influence of
the inner-shelf framework on coastal processes. The grid
showing the thickness of Quaternary sediment is an important
factor in the framework of the coastal region.
Resources
| Name | Format | Description | Link |
|---|---|---|---|
| Original Metadata | XML | The metadata original format | Open resource |
| Digital Data | XML | Landing page for access to the data | Open resource |