Description
Preliminary data from thermal overstress accelerated aging using the aging and characterization system. The data set contains aging data from 6 devices, one device aged with DC gate bias and the rest aged with a squared signal gate bias. Several variables are recorded and, in some cases, high-speed measurements of gate voltage, collector-emitter voltage, and collector current are available. The data set is provided by the NASA Prognostics Center of Excellence (PCoE).
Resources
| Name | Format | Description | Link |
|---|---|---|---|
| IGBTAgingData_04022009.zip | ZIP | IGBTAgingData_04022009.zip | Open resource |
| Zip File | ZIP | Open resource |