Harsh Environment Sensors for Geothermal Applications

Description

Technical papers detailing the development of harsh environment sensors for geothermal applications. Principle Investigator is Prof. Albert P. Pisano (University of California, Berkeley). Submission includes a paper about geothermal environmental exposure testing on encapsulant and device materials in addition to a paper pertaining to MEMS Sensors for downhole monitoring of geothermal systems.

Resources

Name Format Description Link
33 This paper reviews the limitations in current down-hole monitoring technologies for geothermal energy systems and introduces microelectromechanical systems (MEMS) sensors as a means of optimizing well performance. https://gdr.openei.org/files/90/UCBerkeley_Pisano_Geothermal_Paper_2.pdf
33 Report detailing mass change and sputter XPS chemical analysis conducted on silicon, sapphire, silicon carbide (SiC), and aluminum nitride (AlN) after up to 100 hours of exposure testing in water at its critical point. https://gdr.openei.org/files/90/UCBerkeley_Pisano_Geothermal_Paper_1.pdf

Tags

  • sputter-xps
  • mass-change
  • harsh-environment
  • microelectromechanical
  • pressure
  • exposure
  • monitoring
  • mems
  • sapphire
  • silicon-carbide
  • chemical-analysis
  • aluminum-nitride
  • down-hole
  • temperature
  • encapsulation
  • downhole
  • sensor
  • logging
  • geothermal
  • environmental-exposure

Topics

Categories