Description
The data from this instrument consists of sets of measurements of Xray intensity as a function of diffraction angle. Almost all of it is collected using scintillator point detector with a graphite analyzer, and is stored in CIF format.
Resources
| Name | Format | Description | Link |
|---|---|---|---|
| zip archive of CIF datasets from the SRM 660c certification | Unknown | These CIFs have the original data used to certify SRM660c, along with fits to the data indicative of how we processed it. The fits are not the fits actually used in certification, since the models have been updated since then, but give essentially the same results. | Open resource |
| SHA256 File for zip archive of CIF datasets from the SRM 660c certification | Text | Open resource |