Description
The data from this instrument consists of sets of measurements of Xray intensity as a function of diffraction angle. Almost all of it is collected using a position-sensitive detector (PSD), and is stored in CIF format.
Resources
| Name | Format | Description | Link |
|---|---|---|---|
| Diffraction Data for SRM 640f | ZIP | X-ray diffraction data expressed as intensity as a function of angle | Open resource |
| SHA256 File for Diffraction Data for SRM 640f | Text | Open resource | |
| DOI Access for Diffraction Data for SRM 640f | Unknown | Open resource |