Data and scripts associated with "Quantification of STEM-in-SEM Energy Dispersive X-ray Spectra using Bulk Standards"
Description
Spectra measured from SRM-2063a and standards at 20 keV, 25 keV and 30 keV. Scripts for processing this data. Scripts for Monte Carlo simulating thin films of ADM-6005a and Al2O3 on CaF2 and for quantifying these simulated spectra.
Resources
| Name |
Format |
Description |
Link |
|
47 |
The read_me file associated with this data set. |
https://data.nist.gov/od/ds/mds2-2975/2975_README.txt |
|
0 |
X-ray spectra and scripts in a zip file |
https://data.nist.gov/od/ds/mds2-2975/STEMinSEM.zip |
Tags
- thickness
- stem-in-sem
- bulk-standards
- thin-films
- nist-dtsa-ii-software
- energy-dispersive-spectrometry-eds
- quantitative-electron-excited-x-ray-microanalysis