AMB2025-03 High-Cycle Rotating Bending Fatigue Tests of PBF-L Ti-6Al-4V

Description

Specimens from one build of laser powder bed fusion (PBF-L) titanium alloy (Ti-6Al-4V) were split equally into two heat treatment conditions. The first condition is a non-standard hot isostatic pressing (HIP) heat treatment (800 °C, 2 h, argon pressure of 200 MPa, approximately 12 °C/min cooling rate), which will be referred to as 800HIP. The second condition is the same heat treatment but in a vacuum furnace with a partial pressure of argon (75 mTorr), and will be referred to as 800VAC. All fatigue specimens were vertically oriented during PBF-L, then after post-processing was completed, the specimens were machined and polished to remove the as-built surface roughness and PBF-LB contour. Approximately 25 specimens per condition were tested in high-cycle fully reversed 4-point rotating bending fatigue (RBF, R = -1) according to ISO 1143. Calibration data given for both conditions will include: detailed build parameters, heat treatment details (time, temperature, and chamber pressure), solid chemistry, surface roughness measurements of the gauge section of fatigue specimens, strain measured in gauge section of fatigue specimens via x-ray diffraction (XRD), 2D maps of grain size and morphology via scanning electron microscopy (SEM), 2D crystallographic texture via electron backscatter diffraction (EBSD), pore size and spatial distribution via x-ray computed tomography (XCT), and quasi-static tensile properties according to ASTM E8. All fatigue data (S-N curve) for the 800HIP condition will also be given as calibration data.

Resources

Name Format Description Link
5 scan5.osc_r3c0.osc https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XZ/raw%20data/OSC%20format/scan5.osc_r3c0.osc
7 VAC_XY_cleaned_Part1_MapLegend_0to20_GROD.bmp https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/VAC_XY_cleaned/VAC_XY_cleaned_Part1_MapLegend_0to20_GROD.bmp
47 VAC_XY_cleaned_Part1_MapLegend_0to20_GROD.txt https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/VAC_XY_cleaned/VAC_XY_cleaned_Part1_MapLegend_0to20_GROD.txt
7 VAC_XY_cleaned_Part1_MapLegend_0to5_KAM.bmp https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/VAC_XY_cleaned/VAC_XY_cleaned_Part1_MapLegend_0to5_KAM.bmp
47 VAC_XY_cleaned_Part1_MapLegend_0to5_KAM.txt https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/VAC_XY_cleaned/VAC_XY_cleaned_Part1_MapLegend_0to5_KAM.txt
7 VAC_XY_cleaned_Part1_MapLegend_IQ.bmp https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/VAC_XY_cleaned/VAC_XY_cleaned_Part1_MapLegend_IQ.bmp
47 VAC_XY_cleaned_Part1_MapLegend_IQ.txt https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/VAC_XY_cleaned/VAC_XY_cleaned_Part1_MapLegend_IQ.txt
7 VAC_XY_cleaned_Part1_MapLegend_UniqueGrain.bmp https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/VAC_XY_cleaned/VAC_XY_cleaned_Part1_MapLegend_UniqueGrain.bmp
47 VAC_XY_cleaned_Part1_MapLegend_UniqueGrain.txt https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/VAC_XY_cleaned/VAC_XY_cleaned_Part1_MapLegend_UniqueGrain.txt
7 VAC_XY_cleaned_Part1_Map_001_IPF.bmp https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/VAC_XY_cleaned/VAC_XY_cleaned_Part1_Map_001_IPF.bmp
5 CAD_geometry.stp https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/specimen_preparation/CAD_geometry.stp
7 VAC_XY_cleaned_Part1_Map_0to20_GROD.bmp https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/VAC_XY_cleaned/VAC_XY_cleaned_Part1_Map_0to20_GROD.bmp
7 VAC_XY_cleaned_Part1_Map_0to5_KAM.bmp https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/VAC_XY_cleaned/VAC_XY_cleaned_Part1_Map_0to5_KAM.bmp
5 scan5.osc_r0c0.osc https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XZ/raw%20data/OSC%20format/scan5.osc_r0c0.osc
5 scan5.osc_r0c1.osc https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XZ/raw%20data/OSC%20format/scan5.osc_r0c1.osc
5 scan5.osc_r0c2.osc https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XZ/raw%20data/OSC%20format/scan5.osc_r0c2.osc
5 scan5.osc_r0c3.osc https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XZ/raw%20data/OSC%20format/scan5.osc_r0c3.osc
5 scan5.osc_r1c0.osc https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XZ/raw%20data/OSC%20format/scan5.osc_r1c0.osc
5 scan5.osc_r1c1.osc https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XZ/raw%20data/OSC%20format/scan5.osc_r1c1.osc
5 scan5.osc_r1c2.osc https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XZ/raw%20data/OSC%20format/scan5.osc_r1c2.osc
5 scan5.osc_r1c3.osc https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XZ/raw%20data/OSC%20format/scan5.osc_r1c3.osc
5 scan5.osc_r2c0.osc https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XZ/raw%20data/OSC%20format/scan5.osc_r2c0.osc
5 scan5.osc_r2c1.osc https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XZ/raw%20data/OSC%20format/scan5.osc_r2c1.osc
5 scan5.osc_r2c2.osc https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XZ/raw%20data/OSC%20format/scan5.osc_r2c2.osc
7 VAC_XY_cleaned_Part1_Map_IQ.bmp https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/VAC_XY_cleaned/VAC_XY_cleaned_Part1_Map_IQ.bmp
7 VAC_XY_cleaned_Part1_Map_UniqueGrain.bmp https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/VAC_XY_cleaned/VAC_XY_cleaned_Part1_Map_UniqueGrain.bmp
47 VAC_XY_cleaned_Part1_PartitionLegend.txt https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/VAC_XY_cleaned/VAC_XY_cleaned_Part1_PartitionLegend.txt
7 VAC_XZ_cleaned_Part1_Chart_GS%20%28area%29.bmp https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/VAC_XZ_cleaned/VAC_XZ_cleaned_Part1_Chart_GS%20%28area%29.bmp
7 VAC_XZ_cleaned_Part1_MapLegend_010_IPF.bmp https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/VAC_XZ_cleaned/VAC_XZ_cleaned_Part1_MapLegend_010_IPF.bmp
47 VAC_XZ_cleaned_Part1_MapLegend_010_IPF.txt https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/VAC_XZ_cleaned/VAC_XZ_cleaned_Part1_MapLegend_010_IPF.txt
7 VAC_XZ_cleaned_Part1_MapLegend_0to20_GROD.bmp https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/VAC_XZ_cleaned/VAC_XZ_cleaned_Part1_MapLegend_0to20_GROD.bmp
47 VAC_XZ_cleaned_Part1_MapLegend_0to20_GROD.txt https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/VAC_XZ_cleaned/VAC_XZ_cleaned_Part1_MapLegend_0to20_GROD.txt
5 scan5.osc_r2c3.osc https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XZ/raw%20data/OSC%20format/scan5.osc_r2c3.osc
5 scan5.osc_r3c1.osc https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XZ/raw%20data/OSC%20format/scan5.osc_r3c1.osc
5 scan5.osc_r3c2.osc https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XZ/raw%20data/OSC%20format/scan5.osc_r3c2.osc
5 scan5.osc_r3c3.osc https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XZ/raw%20data/OSC%20format/scan5.osc_r3c3.osc
5 VAC_XZ_cleaned.ang https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XZ/stitched%20and%20cleaned%20data/ANG%20format/VAC_XZ_cleaned.ang
5 VAC_XZ_cleaned.osc https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XZ/stitched%20and%20cleaned%20data/OSC%20format/VAC_XZ_cleaned.osc
5 VAC_XZ_stitchedinv9.osc https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XZ/stitched%20and%20cleaned%20data/OSC%20format/VAC_XZ_stitchedinv9.osc
5 VAC_XZ_stitchedinv9croppedinv8.osc https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XZ/stitched%20and%20cleaned%20data/OSC%20format/VAC_XZ_stitchedinv9croppedinv8.osc
33 readme.pdf https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/readme.pdf
7 VAC_XZ_cleaned_Part1_MapLegend_0to5_KAM.bmp https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/VAC_XZ_cleaned/VAC_XZ_cleaned_Part1_MapLegend_0to5_KAM.bmp
47 VAC_XZ_cleaned_Part1_MapLegend_0to5_KAM.txt https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/VAC_XZ_cleaned/VAC_XZ_cleaned_Part1_MapLegend_0to5_KAM.txt
7 VAC_XZ_cleaned_Part1_MapLegend_IQ.bmp https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/VAC_XZ_cleaned/VAC_XZ_cleaned_Part1_MapLegend_IQ.bmp
47 VAC_XZ_cleaned_Part1_MapLegend_IQ.txt https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/VAC_XZ_cleaned/VAC_XZ_cleaned_Part1_MapLegend_IQ.txt
7 VAC_XZ_cleaned_Part1_MapLegend_UniqueGrain.bmp https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/VAC_XZ_cleaned/VAC_XZ_cleaned_Part1_MapLegend_UniqueGrain.bmp
47 VAC_XZ_cleaned_Part1_MapLegend_UniqueGrain.txt https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/VAC_XZ_cleaned/VAC_XZ_cleaned_Part1_MapLegend_UniqueGrain.txt
7 VAC_XZ_cleaned_Part1_Map_010_IPF.bmp https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/VAC_XZ_cleaned/VAC_XZ_cleaned_Part1_Map_010_IPF.bmp
7 VAC_XZ_cleaned_Part1_Map_0to20_GROD.bmp https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/VAC_XZ_cleaned/VAC_XZ_cleaned_Part1_Map_0to20_GROD.bmp
7 VAC_XZ_cleaned_Part1_Map_0to5_KAM.bmp https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/VAC_XZ_cleaned/VAC_XZ_cleaned_Part1_Map_0to5_KAM.bmp
7 VAC_XZ_cleaned_Part1_Map_IQ.bmp https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/VAC_XZ_cleaned/VAC_XZ_cleaned_Part1_Map_IQ.bmp
7 VAC_XZ_cleaned_Part1_Map_UniqueGrain.bmp https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/VAC_XZ_cleaned/VAC_XZ_cleaned_Part1_Map_UniqueGrain.bmp
47 VAC_XZ_cleaned_Part1_PartitionLegend.txt https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/VAC_XZ_cleaned/VAC_XZ_cleaned_Part1_PartitionLegend.txt
47 readme.txt https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/solid_chemistry/readme.txt
53 solid_chemistry.xlsx https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/solid_chemistry/solid_chemistry.xlsx
5 CAD_geometry.ipt https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/specimen_preparation/CAD_geometry.ipt
0 polished_RBF_specimen_geometry.dwg https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/specimen_preparation/polished_RBF_specimen_geometry.dwg
33 polished_RBF_specimen_geometry.pdf https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/specimen_preparation/polished_RBF_specimen_geometry.pdf
47 readme.txt https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/specimen_preparation/readme.txt
57 raw_data.zip https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/tensile_testing/raw_data.zip
47 readme.txt https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/tensile_testing/readme.txt
53 tensile_properties.xlsx https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/tensile_testing/tensile_properties.xlsx
33 ReadMe_01312025_v3.pdf https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/x-ray_computed_tomography/ReadMe_01312025_v3.pdf
5 BottomFrontScoutImage.xrm https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/x-ray_computed_tomography/raw_xct_data/RBF_05_VAC/RBF_05_2024-10-10_115057/NailPolishDimpleUp_PixSz5p5um/BottomFrontScoutImage.xrm
5 BottomSideScoutImage.xrm https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/x-ray_computed_tomography/raw_xct_data/RBF_05_VAC/RBF_05_2024-10-10_115057/NailPolishDimpleUp_PixSz5p5um/BottomSideScoutImage.xrm
5 RBF_05_NailPolishDimpleUp_PixSz5p5um_000.txrm https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/x-ray_computed_tomography/raw_xct_data/RBF_05_VAC/RBF_05_2024-10-10_115057/NailPolishDimpleUp_PixSz5p5um/RBF_05_NailPolishDimpleUp_PixSz5p5um_000.txrm
5 XY.opt https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/templates_for_map_exports/XY.opt
5 Z.opt https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/templates_for_map_exports/Z.opt
5 scan2.osc_r0c0.ang https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_HIP_XY/raw%20data/ANGformat/scan2.osc_r0c0.ang
5 scan2.osc_r0c1.ang https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_HIP_XY/raw%20data/ANGformat/scan2.osc_r0c1.ang
5 scan2.osc_r0c2.ang https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_HIP_XY/raw%20data/ANGformat/scan2.osc_r0c2.ang
5 scan2.osc_r0c3.ang https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_HIP_XY/raw%20data/ANGformat/scan2.osc_r0c3.ang
5 scan2.osc_r1c0.ang https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_HIP_XY/raw%20data/ANGformat/scan2.osc_r1c0.ang
5 scan2.osc_r1c1.ang https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_HIP_XY/raw%20data/ANGformat/scan2.osc_r1c1.ang
5 scan2.osc_r1c2.ang https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_HIP_XY/raw%20data/ANGformat/scan2.osc_r1c2.ang
5 scan2.osc_r1c3.ang https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_HIP_XY/raw%20data/ANGformat/scan2.osc_r1c3.ang
5 scan2.osc_r2c0.ang https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_HIP_XY/raw%20data/ANGformat/scan2.osc_r2c0.ang
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5 RBF_94_RunOut_DimpleUp_PixSz5p5um_Drift_002.txrm https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/x-ray_computed_tomography/raw_xct_data/RBF_94_HIP_RunOut/RBF_94_RunOut_2024-10-16_094323/DimpleUp_PixSz5p5um/RBF_94_RunOut_DimpleUp_PixSz5p5um_Drift_002.txrm
5 RBF_94_RunOut_DimpleUp_PixSz5p5um_Drift_003.txrm https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/x-ray_computed_tomography/raw_xct_data/RBF_94_HIP_RunOut/RBF_94_RunOut_2024-10-16_094323/DimpleUp_PixSz5p5um/RBF_94_RunOut_DimpleUp_PixSz5p5um_Drift_003.txrm
34 RBF_94_RunOut_DimpleUp_PixSz5p5um_recipe.png https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/x-ray_computed_tomography/raw_xct_data/RBF_94_HIP_RunOut/RBF_94_RunOut_2024-10-16_094323/DimpleUp_PixSz5p5um/RBF_94_RunOut_DimpleUp_PixSz5p5um_recipe.png
5 RBF_94_RunOut_DimpleUp_PixSz5p5um_recon_000.txm https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/x-ray_computed_tomography/raw_xct_data/RBF_94_HIP_RunOut/RBF_94_RunOut_2024-10-16_094323/DimpleUp_PixSz5p5um/RBF_94_RunOut_DimpleUp_PixSz5p5um_recon_000.txm
5 RBF_94_RunOut_DimpleUp_PixSz5p5um_recon_001.txm https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/x-ray_computed_tomography/raw_xct_data/RBF_94_HIP_RunOut/RBF_94_RunOut_2024-10-16_094323/DimpleUp_PixSz5p5um/RBF_94_RunOut_DimpleUp_PixSz5p5um_recon_001.txm
5 scan4.osc_r3c2.osc https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XY/raw%20data/OSCformat/scan4.osc_r3c2.osc
5 RBF_94_RunOut_DimpleUp_PixSz5p5um_recon_002.txm https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/x-ray_computed_tomography/raw_xct_data/RBF_94_HIP_RunOut/RBF_94_RunOut_2024-10-16_094323/DimpleUp_PixSz5p5um/RBF_94_RunOut_DimpleUp_PixSz5p5um_recon_002.txm
5 RBF_94_RunOut_DimpleUp_PixSz5p5um_recon_003.txm https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/x-ray_computed_tomography/raw_xct_data/RBF_94_HIP_RunOut/RBF_94_RunOut_2024-10-16_094323/DimpleUp_PixSz5p5um/RBF_94_RunOut_DimpleUp_PixSz5p5um_recon_003.txm
7 HIP_XY_cleaned_Part1_Map_IQ.bmp https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/HIP_XY_cleaned/HIP_XY_cleaned_Part1_Map_IQ.bmp
7 HIP_XY_cleaned_Part1_Map_UniqueGrain.bmp https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/HIP_XY_cleaned/HIP_XY_cleaned_Part1_Map_UniqueGrain.bmp
47 HIP_XY_cleaned_Part1_PartitionLegend.txt https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/HIP_XY_cleaned/HIP_XY_cleaned_Part1_PartitionLegend.txt
7 HIP_XZ_cleaned_Part1_ChartLegend_Auto%20Misorientation%20Angle.bmp https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/HIP_XZ_cleaned/HIP_XZ_cleaned_Part1_ChartLegend_Auto%20Misorientation%20Angle.bmp
47 HIP_XZ_cleaned_Part1_ChartLegend_Auto%20Misorientation%20Angle.txt https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/HIP_XZ_cleaned/HIP_XZ_cleaned_Part1_ChartLegend_Auto%20Misorientation%20Angle.txt
7 HIP_XZ_cleaned_Part1_ChartLegend_GS%20%28area%29.bmp https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/HIP_XZ_cleaned/HIP_XZ_cleaned_Part1_ChartLegend_GS%20%28area%29.bmp
47 HIP_XZ_cleaned_Part1_ChartLegend_GS%20%28area%29.txt https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/HIP_XZ_cleaned/HIP_XZ_cleaned_Part1_ChartLegend_GS%20%28area%29.txt
7 HIP_XZ_cleaned_Part1_Chart_Auto%20Misorientation%20Angle.bmp https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/HIP_XZ_cleaned/HIP_XZ_cleaned_Part1_Chart_Auto%20Misorientation%20Angle.bmp
7 HIP_XZ_cleaned_Part1_Chart_GS%20%28area%29.bmp https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/HIP_XZ_cleaned/HIP_XZ_cleaned_Part1_Chart_GS%20%28area%29.bmp
7 HIP_XZ_cleaned_Part1_MapLegend_010_IPF.bmp https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/HIP_XZ_cleaned/HIP_XZ_cleaned_Part1_MapLegend_010_IPF.bmp
47 HIP_XZ_cleaned_Part1_MapLegend_010_IPF.txt https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/HIP_XZ_cleaned/HIP_XZ_cleaned_Part1_MapLegend_010_IPF.txt
5 scan4.osc_r1c1.osc https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XY/raw%20data/OSCformat/scan4.osc_r1c1.osc
5 scan4.osc_r1c2.osc https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XY/raw%20data/OSCformat/scan4.osc_r1c2.osc
5 scan4.osc_r1c3.osc https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XY/raw%20data/OSCformat/scan4.osc_r1c3.osc
5 scan4.osc_r2c0.osc https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XY/raw%20data/OSCformat/scan4.osc_r2c0.osc
5 scan4.osc_r2c1.osc https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XY/raw%20data/OSCformat/scan4.osc_r2c1.osc
5 scan4.osc_r2c2.osc https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XY/raw%20data/OSCformat/scan4.osc_r2c2.osc
5 scan4.osc_r2c3.osc https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XY/raw%20data/OSCformat/scan4.osc_r2c3.osc
5 scan4.osc_r3c0.osc https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XY/raw%20data/OSCformat/scan4.osc_r3c0.osc
5 scan4.osc_r3c1.osc https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XY/raw%20data/OSCformat/scan4.osc_r3c1.osc
5 RBF_94_RunOut_DimpleUp_PixSz5p5um_recon_ALL.txm https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/x-ray_computed_tomography/raw_xct_data/RBF_94_HIP_RunOut/RBF_94_RunOut_2024-10-16_094323/DimpleUp_PixSz5p5um/RBF_94_RunOut_DimpleUp_PixSz5p5um_recon_ALL.txm
5 TopFrontScoutImage.xrm https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/x-ray_computed_tomography/raw_xct_data/RBF_94_HIP_RunOut/RBF_94_RunOut_2024-10-16_094323/DimpleUp_PixSz5p5um/TopFrontScoutImage.xrm
5 TopSideScoutImage.xrm https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/x-ray_computed_tomography/raw_xct_data/RBF_94_HIP_RunOut/RBF_94_RunOut_2024-10-16_094323/DimpleUp_PixSz5p5um/TopSideScoutImage.xrm
57 recon_imgs_16bit.zip https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/x-ray_computed_tomography/raw_xct_data/RBF_94_HIP_RunOut/RBF_94_RunOut_2024-10-16_094323/DimpleUp_PixSz5p5um/recon_imgs_16bit.zip
5 RBF_94_RunOut.rcp https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/x-ray_computed_tomography/raw_xct_data/RBF_94_HIP_RunOut/RBF_94_RunOut_2024-10-16_094323/RBF_94_RunOut.rcp
57 RBF_05_VAC.zip https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/x-ray_computed_tomography/xct_analysis/RBF_05_VAC.zip
57 RBF_09_VAC.zip https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/x-ray_computed_tomography/xct_analysis/RBF_09_VAC.zip
7 HIP_XZ_cleaned_Part1_MapLegend_0to20_GROD.bmp https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/HIP_XZ_cleaned/HIP_XZ_cleaned_Part1_MapLegend_0to20_GROD.bmp
47 HIP_XZ_cleaned_Part1_MapLegend_0to20_GROD.txt https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/HIP_XZ_cleaned/HIP_XZ_cleaned_Part1_MapLegend_0to20_GROD.txt
7 HIP_XZ_cleaned_Part1_MapLegend_0to5_KAM.bmp https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/HIP_XZ_cleaned/HIP_XZ_cleaned_Part1_MapLegend_0to5_KAM.bmp
47 HIP_XZ_cleaned_Part1_MapLegend_0to5_KAM.txt https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/HIP_XZ_cleaned/HIP_XZ_cleaned_Part1_MapLegend_0to5_KAM.txt
7 HIP_XZ_cleaned_Part1_MapLegend_IQ.bmp https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/HIP_XZ_cleaned/HIP_XZ_cleaned_Part1_MapLegend_IQ.bmp
47 HIP_XZ_cleaned_Part1_MapLegend_IQ.txt https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/HIP_XZ_cleaned/HIP_XZ_cleaned_Part1_MapLegend_IQ.txt
7 HIP_XZ_cleaned_Part1_MapLegend_UniqueGrain.bmp https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/HIP_XZ_cleaned/HIP_XZ_cleaned_Part1_MapLegend_UniqueGrain.bmp
47 HIP_XZ_cleaned_Part1_MapLegend_UniqueGrain.txt https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/HIP_XZ_cleaned/HIP_XZ_cleaned_Part1_MapLegend_UniqueGrain.txt
7 HIP_XZ_cleaned_Part1_Map_010_IPF.bmp https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/HIP_XZ_cleaned/HIP_XZ_cleaned_Part1_Map_010_IPF.bmp
7 HIP_XZ_cleaned_Part1_Map_0to20_GROD.bmp https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/HIP_XZ_cleaned/HIP_XZ_cleaned_Part1_Map_0to20_GROD.bmp
7 HIP_XZ_cleaned_Part1_Map_0to5_KAM.bmp https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/HIP_XZ_cleaned/HIP_XZ_cleaned_Part1_Map_0to5_KAM.bmp
5 scan4.osc_r3c3.osc https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XY/raw%20data/OSCformat/scan4.osc_r3c3.osc
5 VAC_XY_cleaned.ang https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XY/stitched%20and%20cleaned%20data/ANGformat/VAC_XY_cleaned.ang
5 VAC_XY_cleaned.osc https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XY/stitched%20and%20cleaned%20data/OSCformat/VAC_XY_cleaned.osc
5 VAC_runout81_XY_cropinv8.osc https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XY/stitched%20and%20cleaned%20data/OSCformat/VAC_runout81_XY_cropinv8.osc
5 VAC_runout81_XY_stitchinv9.osc https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XY/stitched%20and%20cleaned%20data/OSCformat/VAC_runout81_XY_stitchinv9.osc
5 scan5.osc_r0c0.ang https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XZ/raw%20data/ANG%20format/scan5.osc_r0c0.ang
5 scan5.osc_r0c1.ang https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XZ/raw%20data/ANG%20format/scan5.osc_r0c1.ang
5 scan5.osc_r0c2.ang https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XZ/raw%20data/ANG%20format/scan5.osc_r0c2.ang
5 scan5.osc_r0c3.ang https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XZ/raw%20data/ANG%20format/scan5.osc_r0c3.ang
5 scan5.osc_r1c0.ang https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XZ/raw%20data/ANG%20format/scan5.osc_r1c0.ang
5 scan5.osc_r1c1.ang https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XZ/raw%20data/ANG%20format/scan5.osc_r1c1.ang
57 RBF_105_VAC.zip https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/x-ray_computed_tomography/xct_analysis/RBF_105_VAC.zip
57 RBF_21_VAC.zip https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/x-ray_computed_tomography/xct_analysis/RBF_21_VAC.zip
57 RBF_94_HIP_Runout.zip https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/x-ray_computed_tomography/xct_analysis/RBF_94_HIP_Runout.zip
57 python_scripts.zip https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/x-ray_computed_tomography/xct_analysis/python_scripts.zip
53 Internal_HIP_102_RO_microscopic.xlsx https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/x-ray_diffraction/Internal_HIP_102_RO_microscopic.xlsx
53 Internal_VAC_81_RO_microscopic.xlsx https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/x-ray_diffraction/Internal_VAC_81_RO_microscopic.xlsx
53 Surface_HIP_66_UT_microscopic.xlsx https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/x-ray_diffraction/Surface_HIP_66_UT_microscopic.xlsx
53 Surface_HIP_94_RO_macroscopic.xlsx https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/x-ray_diffraction/Surface_HIP_94_RO_macroscopic.xlsx
53 Surface_VAC_29_RO_macroscopic.xlsx https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/x-ray_diffraction/Surface_VAC_29_RO_macroscopic.xlsx
53 Surface_VAC_73_UT_microscopic.xlsx https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/x-ray_diffraction/Surface_VAC_73_UT_microscopic.xlsx
48 XRD_total_comparison.tif https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/x-ray_diffraction/XRD_total_comparison.tif
47 readme.txt https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/x-ray_diffraction/readme.txt
53 prediction%20submission%20template.xlsx https://data.nist.gov/od/ds/ark:/88434/mds2-3734/prediction%20submission%20template.xlsx
7 HIP_XZ_cleaned_Part1_Map_IQ.bmp https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/HIP_XZ_cleaned/HIP_XZ_cleaned_Part1_Map_IQ.bmp
7 HIP_XZ_cleaned_Part1_Map_UniqueGrain.bmp https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/HIP_XZ_cleaned/HIP_XZ_cleaned_Part1_Map_UniqueGrain.bmp
47 HIP_XZ_cleaned_Part1_PartitionLegend.txt https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/HIP_XZ_cleaned/HIP_XZ_cleaned_Part1_PartitionLegend.txt
7 VAC_XY_cleaned_Part1_ChartLegend_Auto%20Misorientation%20Angle.bmp https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/VAC_XY_cleaned/VAC_XY_cleaned_Part1_ChartLegend_Auto%20Misorientation%20Angle.bmp
47 VAC_XY_cleaned_Part1_ChartLegend_Auto%20Misorientation%20Angle.txt https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/VAC_XY_cleaned/VAC_XY_cleaned_Part1_ChartLegend_Auto%20Misorientation%20Angle.txt
7 VAC_XY_cleaned_Part1_ChartLegend_GS%20%28area%29.bmp https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/VAC_XY_cleaned/VAC_XY_cleaned_Part1_ChartLegend_GS%20%28area%29.bmp
47 VAC_XY_cleaned_Part1_ChartLegend_GS%20%28area%29.txt https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/VAC_XY_cleaned/VAC_XY_cleaned_Part1_ChartLegend_GS%20%28area%29.txt
7 VAC_XY_cleaned_Part1_Chart_Auto%20Misorientation%20Angle.bmp https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/VAC_XY_cleaned/VAC_XY_cleaned_Part1_Chart_Auto%20Misorientation%20Angle.bmp
7 VAC_XY_cleaned_Part1_Chart_GS%20%28area%29.bmp https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/VAC_XY_cleaned/VAC_XY_cleaned_Part1_Chart_GS%20%28area%29.bmp
7 VAC_XY_cleaned_Part1_MapLegend_001_IPF.bmp https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/VAC_XY_cleaned/VAC_XY_cleaned_Part1_MapLegend_001_IPF.bmp
47 VAC_XY_cleaned_Part1_MapLegend_001_IPF.txt https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/maps_and_distributions/VAC_XY_cleaned/VAC_XY_cleaned_Part1_MapLegend_001_IPF.txt
5 scan5.osc_r1c2.ang https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XZ/raw%20data/ANG%20format/scan5.osc_r1c2.ang
5 scan5.osc_r1c3.ang https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XZ/raw%20data/ANG%20format/scan5.osc_r1c3.ang
5 scan5.osc_r2c0.ang https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XZ/raw%20data/ANG%20format/scan5.osc_r2c0.ang
5 scan5.osc_r2c1.ang https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XZ/raw%20data/ANG%20format/scan5.osc_r2c1.ang
5 scan5.osc_r2c2.ang https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XZ/raw%20data/ANG%20format/scan5.osc_r2c2.ang
5 scan5.osc_r2c3.ang https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XZ/raw%20data/ANG%20format/scan5.osc_r2c3.ang
5 scan5.osc_r3c0.ang https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XZ/raw%20data/ANG%20format/scan5.osc_r3c0.ang
5 scan5.osc_r3c1.ang https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XZ/raw%20data/ANG%20format/scan5.osc_r3c1.ang
5 scan5.osc_r3c2.ang https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XZ/raw%20data/ANG%20format/scan5.osc_r3c2.ang
5 scan5.osc_r3c3.ang https://data.nist.gov/od/ds/ark:/88434/mds2-3734/calibration_data/scanning_electron_microscopy/EBSD_data/raw_and_cleaned_data/AMBench2025_PBFL_Ti64_VAC_XZ/raw%20data/ANG%20format/scan5.osc_r3c3.ang
33 readme.pdf https://data.nist.gov/od/ds/ark:/88434/mds2-3734/readme.pdf

Tags

  • powder-bed-fusion
  • laser-powder-bed-fusion
  • 3d-printing
  • additive-manufacturing
  • titanium
  • ti-6al-4v

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